Nagano, Japan

Tatsuro Ogawa

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Opt Corporation. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tatsuro Ogawa. Retrieved from https://idiyas.com/inventor/tatsuro-ogawa-g8ld5bvx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Innovations by Tatsuro Ogawa in Image Processing Technology

Introduction

Tatsuro Ogawa is a notable inventor based in Nagano, Japan. He has made significant contributions to the field of image processing technology. His innovative work focuses on enhancing the capabilities of image processing devices and methods.

Latest Patents

Tatsuro Ogawa holds a patent for an image processing device, camera device, and image processing method. This invention provides an image processing apparatus and method that allows for the easy confirmation of changes in a subject. The technology enables the enlargement of changing parts of an image, facilitating a better understanding of the subject's alterations. The image processing apparatus includes moving part detecting means, moving area image cutting-out means, and corrected/enlarged image generating means. This combination allows for effective image correction and enlargement, addressing distortions caused by photographic lenses.

Career Highlights

Tatsuro Ogawa is associated with Opt Corporation, where he applies his expertise in image processing technology. His work at the company has contributed to advancements in imaging solutions, showcasing his commitment to innovation in this field.

Conclusion

Tatsuro Ogawa's contributions to image processing technology reflect his dedication to enhancing the way we capture and interpret images. His innovative patent demonstrates the potential for significant advancements in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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