Yokohama, Japan

Tatsuro Miyakawa

This inventor holds 1 USPTO granted patent. Top assignees: Fujitsu Corporation, Fujitsu Semiconductor Limited. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tatsuro Miyakawa. Retrieved from https://idiyas.com/inventor/tatsuro-miyakawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations of Tatsuro Miyakawa

Introduction

Tatsuro Miyakawa is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of power estimation through his innovative patent. His work reflects a deep understanding of electrical engineering and its applications in modern technology.

Latest Patents

Miyakawa holds a patent for a "Method and system for power estimation based on a number of signal changes." This invention involves a power estimator that calculates power coefficients for various circuit ranges. The system acquires an average value of signal changes per unit time, allowing for accurate power value calculations based on correction coefficients and power coefficients.

Career Highlights

Throughout his career, Tatsuro Miyakawa has worked with prominent companies such as Fujitsu Corporation and Fujitsu Semiconductor Limited. His experience in these organizations has contributed to his expertise in power estimation technologies.

Collaborations

Miyakawa has collaborated with notable colleagues, including Takayuki Sasaki and Hirohisa Kotegawa. These partnerships have likely enhanced his innovative capabilities and broadened the impact of his work.

Conclusion

Tatsuro Miyakawa's contributions to power estimation technology exemplify the importance of innovation in engineering. His patent and career achievements highlight his role as a significant figure in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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