This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Nihon Micronics. Active years: 2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014
Title: Innovations of Tatsuo Ishigaki in Probe Technology
Introduction
Tatsuo Ishigaki, a notable inventor based in Tokyo, Japan, has made significant contributions to the field of electronic inspection through his innovative patent. With a focus on enhancing the functionality of probe cards and inspection apparatuses, his work reflects the continuous evolution of technology in the inspection and testing industries.
Latest Patents
Ishigaki is credited with a patent for a "Probe card and inspection apparatus," which introduces an automatic switching mechanism. This mechanism is controlled independently from a tester, allowing for flexibility that is not limited by the number of control signals. The probe card features probes designed to make contact with electrodes of various inspection targets, alongside a power supply channel that electrically connects these probes to the tester. Notably, the design incorporates an automatic switching mechanism that divides the power supply channels into multiple wiring portions connected to the probes, effectively shutting off any power supply wiring responsive to electrical fluctuations, such as overcurrent. This innovation includes an electrical fluctuation detection mechanism that identifies defects among the inspection targets, ensuring that the relevant power supply wiring is disabled when necessary.
Career Highlights
Ishigaki currently works at Kabushiki Kaisha Nihon Micronics, a company recognized for its advancements in micronic technology and electronic components. His position affords him the opportunity to influence and contribute to the development of cutting-edge solutions in the electronics industry.
Collaborations
Throughout his career, Tatsuo Ishigaki has collaborated with esteemed colleagues, including Katsuji Hoshi and Akihisa Akahira. These partnerships have fostered a creative environment that enables the exchange of ideas and the advancement of technology.
Conclusion
Tatsuo Ishigaki's innovative approach to probe technology and his recognized patent not only enhance industry standards but also reflect his commitment to improving inspection processes. His work exemplifies the essence of innovation in technology, paving the way for future advancements in electronic inspection and testing methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile