Tashkent, Uzbekistan

Tatiana M Bakhir

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1982.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tatiana M Bakhir. Retrieved from https://idiyas.com/inventor/tatiana-m-bakhir

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:

goldMedal1 out of 834,601 
Other
 patents

Years Active: 1982

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1 patent (USPTO):Explore Patents

Title: Tatiana M Bakhir: Innovator in Chemical Analysis

Introduction

Tatiana M Bakhir is a notable inventor based in Tashkent, Uzbekistan. She has made significant contributions to the field of chemical analysis, particularly through her innovative methods. Her work has garnered attention for its practical applications in determining the depth of chemically aggressive substances.

Latest Patents

Tatiana holds a patent for a "Method of determining the depth of occurrence of a chemically aggressive." This invention showcases her expertise and commitment to advancing chemical analysis techniques. With 1 patent to her name, she continues to pave the way for future innovations in her field.

Career Highlights

Throughout her career, Tatiana has demonstrated a strong dedication to research and development. Her innovative approach has led to advancements that benefit various industries. She is recognized for her analytical skills and her ability to solve complex problems in chemical analysis.

Collaborations

Tatiana has collaborated with esteemed colleagues, including Vitold M Bakhir and Stanislav A Alekhin. These partnerships have enriched her work and contributed to the success of her inventions.

Conclusion

Tatiana M Bakhir is a remarkable inventor whose contributions to chemical analysis are noteworthy. Her innovative methods and collaborative spirit continue to inspire advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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