Azumino, Japan

Tasuku Sano

This inventor holds 1 USPTO granted patent. Top assignees: Casio Computer Co., Ltd., Shinshu University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tasuku Sano. Retrieved from https://idiyas.com/inventor/tasuku-sano-18e456g2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations of Tasuku Sano

Introduction

Tasuku Sano is a notable inventor based in Azumino, Japan. He has made significant contributions to the field of image processing and identification technology. His work has led to the development of innovative devices and methods that enhance the capabilities of image analysis.

Latest Patents

Tasuku Sano holds a patent for a feature quantity extracting device, feature quantity extracting method, identification device, identification method, and program. This invention includes an acquirer for obtaining a captured image of a predetermined target. It also features a specifier that identifies a linear region extending in various directions from the captured image. The extractor then extracts a feature quantity based on pixel values from the specified linear region.

Career Highlights

Throughout his career, Tasuku Sano has worked with esteemed organizations such as Shinshu University and Casio Computer Co., Ltd. His experience in these institutions has allowed him to collaborate with other professionals in the field and contribute to advancements in technology.

Collaborations

Some of his notable coworkers include Ryuhei Okuyama and Akane Minagawa. Their collaborative efforts have further enriched the research and development processes in which they have been involved.

Conclusion

Tasuku Sano's innovative work in image processing and identification technology showcases his expertise and dedication to advancing the field. His contributions continue to influence the development of new technologies and methods in image analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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