Nanchang, China

Tao Liu

This inventor holds 1 USPTO granted patent. Top assignee: Army Academy of Armored Forces. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tao Liu. Retrieved from https://idiyas.com/inventor/tao-liu-uwierncu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 10.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The Innovations of Tao Liu

Introduction

Tao Liu is a notable inventor based in Nanchang, China. He has made significant contributions to the field of adhesive strength testing through his innovative patent. His work is particularly relevant in industries where the integrity of coatings is critical.

Latest Patents

Tao Liu holds a patent for a "Testing device and testing method for adhesive strength of inner hole coating." This invention discloses a testing device that applies axial tension and radial pressure to assess the adhesive strength of inner hole coatings. The device utilizes a pull rod, guide ring, and assisting assembly to perform tensile and shear adhesive strength tests effectively.

Career Highlights

Tao Liu is affiliated with the Army Academy of Armored Forces, where he applies his expertise in materials testing. His innovative approach to adhesive strength testing has the potential to enhance the reliability of coatings used in various applications.

Collaborations

Tao Liu has collaborated with colleagues such as Guozheng Ma and Haidou Wang, contributing to advancements in their field through shared knowledge and expertise.

Conclusion

Tao Liu's contributions to adhesive strength testing exemplify the importance of innovation in engineering and materials science. His patent reflects a commitment to improving testing methods, which can lead to enhanced product reliability and performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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