This inventor holds 1 USPTO granted patent. Top assignee: Itt Manufacturing Enterprises, Inc.. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: The Innovative Contributions of Tao Jiang
Introduction
Tao Jiang is a notable inventor based in Stevenson Ranch, CA (US). He has made significant contributions to the field of materials science, particularly in the detection of defects in layered devices and other materials. His innovative approach has the potential to enhance the reliability and performance of various technological applications.
Latest Patents
Tao Jiang holds a patent titled "Methods and systems for detecting defects in layered devices and other materials." This patent describes various methods for diagnosing defects and disbonds in devices and materials. In some embodiments, the methods involve cooling a portion of a material or device, heating another portion with a heating instrument, and then imaging the material using a thermal imager after the heat is removed. This technique allows for the visualization of disbonds and defects as hotter areas and spots on the material through thermal imaging. He has 1 patent to his name.
Career Highlights
Tao Jiang is currently employed at Itt Manufacturing Enterprises, Inc., where he applies his expertise in materials science to develop innovative solutions. His work focuses on improving the quality and performance of layered devices, which are critical in various industries.
Collaborations
Tao collaborates with his coworker, David Sandiford, who also contributes to the innovative projects at Itt Manufacturing Enterprises, Inc. Their combined efforts aim to push the boundaries of technology and enhance the capabilities of their products.
Conclusion
Tao Jiang's contributions to the field of materials science through his innovative patent demonstrate his commitment to advancing technology. His work not only addresses current challenges in defect detection but also paves the way for future innovations in layered devices.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
