Busan, South Korea

Tao Cai

This inventor holds 1 USPTO granted patent. Top assignee: Pusan National University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tao Cai. Retrieved from https://idiyas.com/inventor/tao-cai-ylo8rhl9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Innovations by Inventor Tao Cai

Introduction

Tao Cai is a notable inventor based in Busan, South Korea. He has made significant contributions to the field of temperature measurement technology. His innovative work has led to the development of a unique temperature-sensitive film and measurement system.

Latest Patents

Tao Cai holds a patent for a "Temperature-sensitive film and temperature measurement system using thereof." This system includes a light source unit that receives excitation light, a target material with the temperature-sensitive film attached, a phosphorescence detector that extracts emission light into a phosphorescence decay signal, and a temperature extraction unit that determines the temperature of the target material using the phosphorescence decay signal. He has 1 patent to his name.

Career Highlights

Tao Cai is affiliated with Pusan National University, where he continues to engage in research and development. His work is recognized for its potential applications in various industries, particularly in improving temperature measurement accuracy.

Collaborations

Tao Cai collaborates with esteemed colleagues, including Kyung Chun Kim and Chang Sik Ha. Their combined expertise enhances the research output and innovation at Pusan National University.

Conclusion

Tao Cai's contributions to temperature measurement technology exemplify the impact of innovative thinking in scientific research. His work continues to inspire advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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