Suwon, South Korea

Tanil Kim

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tanil Kim. Retrieved from https://idiyas.com/inventor/tanil-kim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Tanil Kim: Inventor in Biometric Authentication.

Introduction

Tanil Kim is an inventor based in Suwon, South Korea, whose work includes an invention for electronic devices and biometric authentication. He is associated with Samsung Electronics Ltd. His listed patent portfolio includes 1 patent.

Latest Patents

Kim’s listed patent is “Electronic Device and Biometric Authentication Method Using Same.” The invention describes an electronic device with a fingerprint sensor, a camera, and a processor connected to both. When a user initiates authentication through the fingerprint sensor, the processor determines whether multiple biometric authentications are underway. If they are, it stops camera-based authentication and proceeds with fingerprint authentication when the captured fingerprint image matches a registered image.

Career Highlights

Kim’s listed invention addresses how an electronic device manages fingerprint and camera-based authentication. The patent information provided associates him with Samsung Electronics Ltd.

Collaborations

Jaejeong Jang and Hyeonho Kim are identified as Kim’s coworkers. The information provided does not specify their roles in the patent or the invention.

Conclusion

Tanil Kim’s listed patent focuses on coordinating biometric authentication methods in an electronic device, with fingerprint matching serving as the basis for authentication when the specified conditions are met.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…