Plainview, NY, United States of America

Tania Henry

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Veeco Instruments Inc.. Active years: 2026.

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Tania Henry: Innovator in Ion Beam Deposition Technology

Introduction

Tania Henry is a prominent inventor based in Plainview, NY (US). She has made significant contributions to the field of materials science, particularly in the development of methods for forming thin, low resistivity metal layers. Her innovative work has implications for various applications in electronics and semiconductor manufacturing.

Latest Patents

Tania holds a patent for her invention titled "Ion beam deposition of a low resistivity metal." This patent describes methods for depositing metal materials onto substrates via ion beam deposition. The process is conducted in a chamber at temperatures of at least 250° C, resulting in high-quality metal films. The thin tungsten film produced has large, highly oriented α(110) grains with a resistivity of less than 10 μΩ-cm and a thickness of less than 300 Å. Additionally, the thin ruthenium film has a resistivity of less than 12 μΩ-cm and a thickness of less than 300 Å.

Career Highlights

Tania is currently employed at Veeco Instruments Inc., where she continues to advance her research and development efforts. Her work at Veeco has positioned her as a key player in the field of ion beam deposition technology.

Collaborations

Tania collaborates with her coworker, Frank Cerio, to further enhance the innovative processes and technologies being developed at their company.

Conclusion

Tania Henry's contributions to the field of ion beam deposition are noteworthy, and her patent reflects her commitment to advancing technology in materials science. Her work continues to influence the industry and pave the way for future innovations.

Profile summary based on public USPTO records.
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