Company Filing History:
Years Active: 2004-2006
Title: Tange Nan Barbour: Innovator in Integrated Circuit Reliability
Introduction
Tange Nan Barbour is a notable inventor based in Hinesburg, Vermont, who has made significant contributions to the field of integrated circuit reliability. With a total of 2 patents, her work focuses on enhancing the reliability of semiconductor devices through innovative testing methods.
Latest Patents
Barbour's latest patents include a "Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliability." This invention utilizes defect counts to determine the minimum test time necessary for ensuring the reliability of integrated circuits. A higher number of defective cells results in longer testing times, which is crucial for achieving optimal performance. Additionally, she holds a patent for a "Method of statistical binning for reliability selection," which employs critical wafer yield parameters to select reliable dies on semiconductor wafers. This method combines data from various reliability screens to assess latent defect density, ultimately comparing modeled results with actual outcomes to validate the model.
Career Highlights
Tange Nan Barbour is currently employed at International Business Machines Corporation (IBM), where she continues to innovate in the field of semiconductor reliability. Her work has been instrumental in developing methods that enhance the testing and reliability of integrated circuits.
Collaborations
Throughout her career, Barbour has collaborated with esteemed colleagues such as Thomas S Barnett and Matthew Sean Grady, contributing to advancements in their shared field of expertise.
Conclusion
Tange Nan Barbour's contributions to integrated circuit reliability through her innovative patents and work at IBM highlight her significant role in the advancement of technology. Her dedication to improving testing methods ensures that integrated circuits achieve optimal reliability, making her a valuable figure in the field of semiconductor innovation.