Tokyo, Japan

Tamotsu Ogawa

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Tokyo Electric Power Company Holdings, Inc.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tamotsu Ogawa. Retrieved from https://idiyas.com/inventor/tamotsu-ogawa-1hrq1j2b

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Tamotsu Ogawa: Innovator in Boundary Sample Selection

Introduction

Tamotsu Ogawa is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of device reuse through his innovative methods and systems. His work focuses on enhancing the efficiency and reliability of devices that have undergone repairs.

Latest Patents

Ogawa holds a patent for a "Method for selecting boundary sample, apparatus for selecting boundary sample, storage medium, and system for selecting boundary sample." This method involves acquiring a deterioration trend of a new device by performing a deterioration acceleration treatment. It also includes analyzing the deterioration trends of multiple repaired devices, calculating an upper limit of deterioration, and selecting a boundary sample that indicates a limit state for reuse.

Career Highlights

Tamotsu Ogawa is associated with Tokyo Electric Power Company Holdings, Inc., where he applies his expertise in device management and innovation. His work has been instrumental in developing standards for the reuse of repaired devices, ensuring that they meet safety and performance criteria.

Collaborations

Ogawa has collaborated with notable colleagues such as Noboru Kobayashi and Chikara Morooka. Their combined efforts have contributed to advancements in the field of device repair and reuse.

Conclusion

Tamotsu Ogawa's innovative approach to boundary sample selection has paved the way for improved practices in device reuse. His contributions continue to influence the industry and enhance the reliability of repaired devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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