This inventor holds 1 USPTO granted patent. Top assignee: Nippon Steel Sumitomo Metal Corporation. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015
Title: Tamotsu Nishimine: Innovator in Defect Classification Technology
Introduction
Tamotsu Nishimine is a prominent inventor based in Tokyo, Japan. He is known for his significant contributions to the field of defect classification technology. His innovative approach aims to enhance the accuracy of defect type classification, which is crucial in various industrial applications.
Latest Patents
Nishimine holds a patent for a defect classification apparatus. This invention is designed to suppress over-fitting and accurately classify the defect type of a defect. The apparatus maps a data point indicating feature information of a defect to a point in a higher-dimensional mapping space. The classification is based on the location of the mapped point in relation to a decision boundary that separates different defect types. The discriminant function used to determine this boundary is optimized by minimizing classification errors while considering a regularization term.
Career Highlights
Tamotsu Nishimine is associated with Nippon Steel Sumitomo Metal Corporation, where he applies his expertise in defect classification. His work has contributed to advancements in quality control and defect management within the steel industry. Nishimine's innovative solutions have the potential to improve manufacturing processes and product quality.
Collaborations
Nishimine collaborates with notable colleagues, including Toshiyuki Suzuma and Shinya Yoshikawa. Their combined efforts in research and development have fostered a collaborative environment that encourages innovation and technological advancement.
Conclusion
Tamotsu Nishimine's work in defect classification technology exemplifies the impact of innovation in industrial applications. His patent reflects a commitment to improving accuracy in defect identification, which is essential for enhancing product quality and operational efficiency.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile