Mason, OH, United States of America

Tameem Hayat Khan

This inventor holds 1 USPTO granted patent. Top assignee: Intelligrated Headquarters, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tameem Hayat Khan. Retrieved from https://idiyas.com/inventor/tameem-hayat-khan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Tameem Hayat Khan and Conveyor-System Innovation.

Introduction

Tameem Hayat Khan is an inventor based in Mason, Ohio. His patent work includes a conveyor-system design focused on identifying and responding to faults in motor-driven roller (MDR) operations circuitry. Khan is associated with Intelligrated Headquarters, LLC.

Latest Patents

The provided information lists one patent for Khan: “Conveyor system and an associated method.” The invention describes a system with multiple conveyor sections and a controller. The controller can identify an MDR operations circuitry fault, determine which conveyor section’s circuitry is affected, and initiate one or more response actions based on that determination. Khan’s listed patent count is 1 patent.

Career Highlights

Khan’s listed invention addresses fault detection and response in conveyor operations. By locating a fault within a particular conveyor section, the system is designed to support targeted responses to circuitry problems.

Collaborations

The provided information names Hongjian Li and Xuyong Tu as Khan’s coworkers. Their specific contributions to the patent are not stated.

Conclusion

Tameem Hayat Khan’s listed patent focuses on identifying and responding to MDR circuitry faults in conveyor systems, reflecting an engineering approach to operational fault management.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…