Tel Aviv, Israel

Tal Sharon

This inventor holds 1 USPTO granted patent. Top assignee: Intuit, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tal Sharon. Retrieved from https://idiyas.com/inventor/tal-sharon-b71y65qj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Tal Sharon: Inventor in Data Quality and Repair

Introduction

Tal Sharon is an inventor based in Tel Aviv, Israel, associated with Intuit, Inc. His patent work addresses data quality and the repair of data across source and target databases. He is credited with 1 patent.

Latest Patents

Sharon’s listed patent is “Data Repair Based on Parity Determined Using Join Operation.” The invention describes systems and methods for repairing data by comparing changes in an append-only source database with changes in a materialized version of that data in a target database.

A data quality management system generates datasets representing changes to both the source and target data between the current ingestion time and a previous time. It uses comparisons between these datasets to determine parity for updated and inserted records. For deleted data, it determines parity through a join operation involving the target database and the source data change dataset. The system then uses the resulting parity information to selectively repair target data.

Career Highlights

Sharon’s listed professional affiliation is Intuit, Inc. His patent reflects work on maintaining consistency between databases and identifying data that may require repair.

Collaborations

Sharon’s listed coworkers include Saikiran Sri Thunuguntla and David Zaltsman.

Conclusion

Tal Sharon’s patent focuses on using change comparisons and join-based parity analysis to support selective data repair across databases.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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