Suita, Japan

Takuya Nakada

This inventor holds 1 USPTO granted patent. Top assignee: Omron Corporation. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takuya Nakada. Retrieved from https://idiyas.com/inventor/takuya-nakada-zcqeusgb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Takuya Nakada: Innovator in Industrial Machine Monitoring

Introduction

Takuya Nakada is a prominent inventor based in Suita, Japan. He has made significant contributions to the field of industrial machinery through his innovative designs and patents. His work focuses on enhancing the efficiency and reliability of industrial machines.

Latest Patents

Takuya Nakada holds a patent for a measuring device that monitors the state of industrial machines. This invention is crucial for ensuring optimal performance and preventing potential failures in industrial settings. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Takuya Nakada is currently employed at Omron Corporation, a leading company in automation and control technology. His role at Omron allows him to apply his innovative ideas to real-world applications, contributing to the advancement of industrial technology.

Collaborations

Throughout his career, Takuya has collaborated with talented coworkers, including Shohei Shimahara and Koyuru Nakano. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Takuya Nakada is a dedicated inventor whose work in industrial machine monitoring has made a significant impact in the field. His contributions continue to influence the industry, and his innovative spirit drives ongoing advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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