Toride, Japan

Takuya Hayashi

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi Maxell, Limited. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takuya Hayashi. Retrieved from https://idiyas.com/inventor/takuya-hayashi-sa1vyuy5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Takuya Hayashi: Innovator in Optical Recording Technology

Introduction

Takuya Hayashi is a notable inventor based in Toride, Japan. He has made significant contributions to the field of optical recording technology. His work has been recognized through the granting of a patent, showcasing his innovative spirit and technical expertise.

Latest Patents

Takuya Hayashi holds a patent for an optical recording medium. This invention represents a step forward in the technology used for data storage and retrieval. His patent is a testament to his dedication to advancing optical recording methods.

Career Highlights

Hayashi is currently employed at Hitachi Maxell, Limited, a company known for its advancements in technology and electronics. His role at Hitachi Maxell allows him to work on cutting-edge projects that push the boundaries of optical technology.

Collaborations

Throughout his career, Takuya Hayashi has collaborated with talented individuals such as Yuichi Sakurai and Yoshiyuki Nagataki. These collaborations have likely contributed to the innovative projects and patents that have emerged from their collective efforts.

Conclusion

Takuya Hayashi is a prominent figure in the realm of optical recording technology. His patent and work at Hitachi Maxell highlight his contributions to the field. His collaborations with other skilled professionals further enhance his impact on technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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