Tokyo, Japan

Takumi Kaiya

This inventor holds 6 USPTO granted patents. Top assignee: Fujitsu Frontech Limited. Active years: 2017-2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takumi Kaiya. Retrieved from https://idiyas.com/inventor/takumi-kaiya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.1

ph-index = 6

Forward Citations = 104(Granted Patents)


Company Filing History:


Years Active: 2017-2019

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6 patents (USPTO):Explore Patents

Title: The Innovations of Takumi Kaiya

Introduction

Takumi Kaiya is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of technology, particularly through his work at Fujitsu Frontech Limited. With a total of six patents to his name, Kaiya has established himself as a key figure in innovation.

Latest Patents

One of his latest inventions is a data input machine, which showcases his commitment to enhancing user experience and efficiency in data handling. This invention reflects his ability to address contemporary technological challenges.

Career Highlights

Throughout his career, Takumi Kaiya has been instrumental in developing cutting-edge technologies at Fujitsu Frontech Limited. His work has not only advanced the company's objectives but has also contributed to the broader tech industry.

Collaborations

Kaiya has collaborated with notable colleagues, including Hiroyuki Tanaka and Akinori Tsujikawa. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

In summary, Takumi Kaiya is a distinguished inventor whose work at Fujitsu Frontech Limited has led to significant advancements in technology. His contributions, particularly in the realm of data input machines, highlight his innovative spirit and dedication to improving technological solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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