Odawara, Japan

Takuji Ogawa

This inventor holds 20 USPTO granted patents and 2 published patent applications and 1 EPO patent, primarily in Data Storage Systems. Top assignees: Hitachi, Ltd., Hitachi Computer Peripherals Co., Ltd., Nec Corporation. Active years: 1989-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takuji Ogawa. Retrieved from https://idiyas.com/inventor/takuji-ogawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 20 

% Patents Active = 50.0


Average Co-Inventor Count = 4.4

ph-index = 6

Forward Citations = 258(Granted Patents)


Company Filing History:


Years Active: 1989-2025

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Areas of Expertise:
Data Storage
Disk Array System
Magnetic Recording Drive
Monitoring Method
Cache Memory
Disk Drive
Cooling Structure
Phase Synchronization
Defect Detection
Data Coincidence
Storage System
20 patents (USPTO):Explore Patents

Title: Takuji Ogawa: Pioneering Inventor from Odawara

Introduction: Takuji Ogawa is a renowned inventor hailing from Odawara, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Takuji Ogawa holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous dedication to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Takuji Ogawa has worked with leading tech companies and research institutions, spearheading projects that have revolutionized various industries.

Collaborations: Throughout his career, Takuji Ogawa has collaborated with top engineers, scientists, and researchers from around the world, fostering a culture of innovation and knowledge exchange.

Conclusion: Takuji Ogawa's relentless pursuit of innovation and his passion for creating technology that makes a difference have solidified his position as a trailblazer in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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