Saitama, Japan

Taku Shibata

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Surpass Industry Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Taku Shibata. Retrieved from https://idiyas.com/inventor/taku-shibata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Taku Shibata: Innovator in Flow Rate Adjustment Technology

Introduction

Taku Shibata is a notable inventor based in Saitama, Japan. He has made significant contributions to the field of flow rate adjustment technology. His innovative approach has led to the development of a unique device that enhances the control of fluid dynamics.

Latest Patents

Taku Shibata holds a patent for a "Flow rate adjusting device and control method of flow rate adjusting device." This invention includes an ultrasonic flow metering portion, a flow rate adjusting portion, a flow rate setting unit, and a flow rate fluctuation state detecting unit. The device is designed to detect fluctuations in flow rate and adjust accordingly. It controls the flow rate adjusting portion to move the valve body based on the detected flow rate state, ensuring optimal performance.

Career Highlights

Taku Shibata is currently associated with Surpass Industry Co., Ltd. His work at the company focuses on advancing technologies related to fluid control systems. His expertise in this area has positioned him as a key player in the industry.

Collaborations

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Conclusion

Taku Shibata's contributions to flow rate adjustment technology exemplify his innovative spirit and dedication to improving fluid dynamics. His patent reflects a significant advancement in the field, showcasing his expertise and commitment to innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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