Koganei, Japan

Takeshi Shimi

This inventor holds 1 USPTO granted patent. Top assignee: National Institute of Information and Communications Technology, Incorporated. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takeshi Shimi. Retrieved from https://idiyas.com/inventor/takeshi-shimi-i5r1ph02

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Innovations by Takeshi Shimi in Biological Measurement

Introduction

Takeshi Shimi is an accomplished inventor based in Koganei, Japan. He has made significant contributions to the field of biological measurement, particularly through his innovative patent that enhances the accuracy of sample measurement.

Latest Patents

Takeshi Shimi holds a patent for a "Method of measuring biological sample with high accuracy." This invention features a displacement prevention sheet designed to inhibit a sample from deviating during measurement with a microscope. The sheet is strategically placed between a sample holder and the mounting stage, ensuring that at least part of both surfaces is equipped with displacement prevention means. This innovation is crucial for achieving precise measurements in biological research.

Career Highlights

Takeshi Shimi is affiliated with the National Institute of Information and Communications Technology, Incorporated. His work at this prestigious institution has allowed him to focus on advancing technologies that improve measurement techniques in biological studies.

Conclusion

Takeshi Shimi's contributions to the field of biological measurement through his innovative patent demonstrate his commitment to enhancing research accuracy. His work continues to influence the scientific community positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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