Torrance, CA, United States of America

Takeshi Nakamura

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Denso Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takeshi Nakamura. Retrieved from https://idiyas.com/inventor/takeshi-nakamura-5835dbi8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Takeshi Nakamura: Inventor in Remote Attestation

Introduction

Takeshi Nakamura is an inventor based in Torrance, California, whose patent work addresses remote attestation for resource-constrained devices. His listed patent is associated with DENSO Corporation. He is credited with 1 patent.

Latest Patents

Nakamura’s patent, “Remote Attestation for Resource-Constrained Devices,” describes systems and methods for checking the integrity of data on devices with limited resources. In one embodiment, an attesting device acquires segments of system data in response to an attestation request. It then determines integrity by checking whether a root hash, formed from integrity hashes of those segments, matches a reference hash. The device provides a report based on the integrity result.

Career Highlights

The available information connects Nakamura’s patent activity with DENSO Corporation and highlights his work on device security and integrity verification. The patent describes an approach designed to support remote attestation in resource-constrained systems.

Collaborations

Nakamura’s listed coworkers include Carlos Mora-Golding and Ameer Kashani.

Conclusion

Takeshi Nakamura’s patent focuses on verifying system-data integrity through remote attestation, offering a method suited to resource-constrained devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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