Nara, Japan

Takeshi Katoh

This inventor holds 5 USPTO granted patents. Top assignee: Sharp Kabushiki Kaisha Corporation. Active years: 2008-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takeshi Katoh. Retrieved from https://idiyas.com/inventor/takeshi-katoh-zhovhrkl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 60.0

Average Co-Inventor Count = 3.6

ph-index = 1


Location History:

  • Nara, JP (2008)
  • Kyoto, JP (2009)
  • Sakai, JP (2020 - 2023)

Company Filing History:


Years Active: 2008-2023

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5 patents (USPTO):Explore Patents

Title: Innovations by Takeshi Katoh

Introduction

Takeshi Katoh is a notable inventor based in Nara, Japan. He has made significant contributions to the field of imaging technology, holding a total of 5 patents. His work primarily focuses on developing advanced components for imaging devices.

Latest Patents

Among his latest patents are innovations such as a two-component developer, a developing device, and an image forming device. The two-component developer includes a carrier and a toner. The carrier satisfies specific relationships when a voltage is applied in 1 V steps by a bridge resistance measurement method. The toner is designed to enhance the performance of the developer, ensuring high-quality image formation.

Career Highlights

Takeshi Katoh is associated with Sharp Kabushiki Kaisha Corporation, where he has been instrumental in advancing imaging technologies. His expertise in developing components for imaging devices has positioned him as a key figure in the industry.

Collaborations

He has collaborated with notable coworkers such as Yoshinori Urata and Yoritaka Tsubaki, contributing to various projects that enhance imaging technology.

Conclusion

Takeshi Katoh's innovative work in imaging technology continues to impact the industry significantly. His patents reflect a commitment to advancing the field and improving the quality of imaging devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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