Tokyo, Japan

Takeo Ogasawara

This inventor holds 10 USPTO granted patents. Top assignees: Kowa Company Limited, Yamayo Measuring Tools Co., Ltd., Asahi Kogaku Kogyo K.k.. Active years: 1986-2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takeo Ogasawara. Retrieved from https://idiyas.com/inventor/takeo-ogasawara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.3

ph-index = 9

Forward Citations = 190(Granted Patents)


Company Filing History:


Years Active: 1986-2002

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10 patents (USPTO):Explore Patents

Title: Takeo Ogasawara: Innovator in Telescope Design

Introduction

Takeo Ogasawara is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of optical instruments, particularly in telescope design. With a total of 10 patents to his name, Ogasawara has established himself as a key figure in innovation.

Latest Patents

Among his latest inventions is a telescope body that enhances the functionality and usability of telescopes. This innovation reflects his commitment to improving optical devices for both amateur and professional astronomers.

Career Highlights

Ogasawara has worked with notable companies such as Kowa Company Limited and Yamayo Measuring Tools Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to the development of advanced optical technologies.

Collaborations

Throughout his career, Ogasawara has collaborated with talented individuals, including Fumihiko Matsubayashi and Takayuki Ishida. These partnerships have fostered a creative environment that has led to groundbreaking innovations in the field.

Conclusion

Takeo Ogasawara's work in telescope design and his numerous patents highlight his dedication to innovation in optical instruments. His contributions continue to influence the industry and inspire future inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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