YamatoTakada, Japan

Takenobu Yoshikawa

This inventor holds 1 USPTO granted patent. Top assignees: Fuji Electrochemical Co., Ltd., Hirano Tecseed Co., Ltd.. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takenobu Yoshikawa. Retrieved from https://idiyas.com/inventor/takenobu-yoshikawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: The Innovations of Takenobu Yoshikawa

Introduction

Takenobu Yoshikawa is a notable inventor based in Yamato Takada, Japan. He has made significant contributions to the field of technology, particularly in the area of coating processes. His work has been recognized for its innovative approach and practical applications.

Latest Patents

Yoshikawa holds a patent for a "Process and apparatus for interment coating of a sheet without wrinkling." This invention addresses common issues in coating processes, providing a solution that enhances the quality and efficiency of the application.

Career Highlights

Throughout his career, Yoshikawa has worked with prominent companies, including Fuji Electrochemical Co., Ltd. and Hirano Tecseed Co., Ltd. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in the industry.

Collaborations

Yoshikawa has collaborated with talented individuals such as Yoshiro Harada and Kohei Yamamoto. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

Takenobu Yoshikawa's contributions to the field of coating technology exemplify the spirit of innovation. His patent and collaborations highlight his commitment to advancing industry standards and improving processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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