This inventor holds 2 USPTO granted patents. Top assignee: Kabushiki Kaisha Topcon. Active years: 2008-2011.
Company Filing History:
Years Active: 2008-2011
Title: Takehiro Takase: Innovator in Surface Inspection Technology
Introduction
Takehiro Takase is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of surface inspection technology, holding 2 patents that showcase his innovative approach to optical flux and laser applications.
Latest Patents
His latest patents include a "Surface Inspecting Method and Device" and a "Surface Inspection Method and Apparatus." The first patent describes a light source section that outputs optical flux with two types of wavelengths, allowing for variable intensity. This method involves comparing outputs from light intensity detecting sections to calculate a disappearance level, enabling precise measurements of internal subjects. The second patent outlines a method for inspecting the surface of a wafer using multiple laser types, ensuring that inspection conditions are automatically set based on film parameters such as thickness and refraction index.
Career Highlights
Takehiro Takase is associated with Kabushiki Kaisha Topcon, a company known for its advancements in optical technology. His work has significantly impacted the efficiency and accuracy of surface inspections in various applications.
Collaborations
He collaborates with notable coworkers, including Michihiro Yamazaki and Hisashi Isozaki, contributing to a dynamic team focused on innovation in their field.
Conclusion
Takehiro Takase's contributions to surface inspection technology reflect his dedication to advancing optical methods. His patents demonstrate a commitment to improving measurement accuracy and efficiency in various applications.