Obu, Japan

Takehiro Abeta

This inventor holds 1 USPTO granted patent. Top assignee: Nippondenso Co., Ltd.. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takehiro Abeta. Retrieved from https://idiyas.com/inventor/takehiro-abeta-k93w2gc7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 31(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Takehiro Abeta: Innovator in Automotive Technology

Introduction

Takehiro Abeta is a notable inventor based in Obu, Japan. He has made significant contributions to the field of automotive technology. His innovative work focuses on enhancing vehicle diagnostics and safety.

Latest Patents

Takehiro Abeta holds a patent for a self-diagnosing apparatus for motor vehicles. This invention aims to improve the reliability and efficiency of vehicle maintenance. It allows for real-time diagnostics, ensuring that potential issues are identified before they become serious problems. He has 1 patent to his name.

Career Highlights

Abeta is currently employed at Nippondenso Co., Ltd., a leading company in the automotive industry. His role involves developing advanced technologies that contribute to safer and more efficient vehicles. His expertise in automotive systems has positioned him as a valuable asset to his team.

Collaborations

Takehiro Abeta has worked alongside talented colleagues, including Takahide Abe and Katsumi Takaba. Their collaborative efforts have led to advancements in automotive technology and innovation.

Conclusion

Takehiro Abeta's contributions to automotive technology through his patent and work at Nippondenso Co., Ltd. highlight his commitment to innovation in the industry. His efforts continue to pave the way for safer and more efficient vehicles.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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