This inventor holds 1 USPTO granted patent. Top assignees: Ntt Facilities, Inc., Origin Electric Company, Limited. Active years: 2012.
Company Filing History:
Years Active: 2012
Title: Takeharu Ueda: Innovator in Acid Liquid Leakage Detection
Introduction
Takeharu Ueda is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of sensor technology, particularly in detecting acid liquid leakage from devices such as batteries. His innovative approach has led to the development of a unique sensor that enhances safety and reliability in various applications.
Latest Patents
Ueda holds a patent for an acid liquid leakage sensor. This sensor is designed to quickly detect liquid leakage from devices containing acid liquids. It consists of a first conductive member, a second conductive member, and an electrically insulating material that maintains an insulating state between the two conductive members. The insulating material includes a macromolecular compound with a basic functional group, which exhibits a decrease in electrical insulation characteristics upon contact with an acid liquid. This allows for the detection of acid liquid leakage by monitoring changes in the conductive state between the two members.
Career Highlights
Throughout his career, Takeharu Ueda has worked with several prominent companies. He has been associated with Origin Electric Company, Limited and NTT Facilities, Inc. His experience in these organizations has contributed to his expertise in sensor technology and innovation.
Collaborations
Ueda has collaborated with notable colleagues, including Kunihisa Satoh and Tomonobu Tsujikawa. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Takeharu Ueda's contributions to the field of acid liquid leakage detection exemplify his commitment to innovation and safety. His patented technology represents a significant advancement in sensor technology, showcasing his expertise and dedication to improving device reliability.