This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Evident Corporation. Active years: 2024-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2024-2026
Title: Takayuki Komiya: Innovator in Measurement Systems
Introduction
Takayuki Komiya is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of measurement systems, particularly through his innovative patent. His work focuses on enhancing the accuracy and efficiency of optical measurement instruments.
Latest Patents
Komiya holds a patent for a "Measurement system, measurement support method, and computer-readable medium." This measurement system includes an optical measurement instrument designed to measure the surface of a specimen. The control apparatus associated with this system features non-transitory computer-readable media that contain specific instructions. These instructions enable the processors to execute operations that allow the measurement instrument to repetitively measure the specimen's surface without altering the settings. Furthermore, the system evaluates the appropriateness of these settings by comparing measurement values with the degree of variation in measurements.
Career Highlights
Komiya is currently employed at Evident Corporation, where he continues to develop and refine measurement technologies. His expertise in optical measurement systems has positioned him as a key player in the industry. With a focus on innovation, he strives to improve measurement techniques that can benefit various applications.
Collaborations
Some of his notable coworkers include Takahiro Furukawa and Yosuke Tani. Their collaborative efforts contribute to the advancement of measurement technologies within the company.
Conclusion
Takayuki Komiya's work in measurement systems exemplifies the importance of innovation in technology. His patent reflects a commitment to improving measurement accuracy and efficiency, which is vital for various scientific and industrial applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile