Tokyo, Japan

Takayasu Iwatsuka

USPTO Granted Patents = 2 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023-2025

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2 patents (USPTO):

Title: The Innovations of Takayasu Iwatsuka: A Leader in Charged Particle Beam Technology

Introduction

Takayasu Iwatsuka, an esteemed inventor based in Tokyo, Japan, has made significant contributions to the field of charged particle beam technology. As a dedicated professional at Hitachi High-Tech Corporation, he has focused his research on developing methods to measure high-frequency electrical noise, which is crucial for enhancing the performance of charged particle beam devices.

Latest Patents

Iwatsuka holds a patent titled "Charged Particle Beam Device and Method of Measuring Electrical Noise." This innovative invention is designed to provide an effective technique for measuring high-frequency electrical noise in charged particle beam devices. The patent outlines a system that includes an electron source for generating an electron beam, a stage for mounting samples, and a detector for capturing secondary electrons emitted from these samples. The control unit, which connects all components, plays a pivotal role in calculating the time-series change in the irradiation position of the electron beam, allowing for precise analysis of the feature quantity related to the shake of the electron beam.

Career Highlights

Throughout his career at Hitachi High-Tech Corporation, Takayasu Iwatsuka has been instrumental in advancing technological innovations in electron microscopy and material science. His work not only showcases his technical expertise but also highlights the impact of his research on optimizing charged particle beam applications across various industrial sectors.

Collaborations

Iwatsuka's innovative journey has been supported by collaboration with talented coworkers such as Tomoyo Sasaki and Wen Zheng Li. Their collective efforts in research and development have further enriched the possibilities within charged particle beam technology, allowing for enhanced accuracy and efficiency in measuring electrical phenomena.

Conclusion

In conclusion, Takayasu Iwatsuka is a prominent figure in the realm of charged particle beam technology. With a noteworthy patent and impactful collaborations, his contributions continue to push the boundaries of innovation in the measurement and analysis of electrical noise. Iwatsuka's work not only fortifies his position as a leading inventor but also contributes significantly to the advancement of technological applications within the field.

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