Yachiyo, Japan

Takashi Tomie

This inventor holds 1 USPTO granted patent. Top assignee: Nissei Plastic Industrial Co., Ltd.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takashi Tomie. Retrieved from https://idiyas.com/inventor/takashi-tomie-i44nsejs

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Takashi Tomie: Innovator in Optical Recording Technology

Introduction

Takashi Tomie is a notable inventor based in Yachiyo, Japan. He has made significant contributions to the field of optical recording technology. His work has led to advancements that enhance the efficiency and effectiveness of optical media.

Latest Patents

One of Takashi Tomie's key patents is for an optical recording substrate, optical recording medium, and the manufacturing method thereof. This patent outlines a method of manufacturing an optical recording substrate, which includes several innovative steps aimed at improving the quality and performance of optical recording media. He holds 1 patent in this area.

Career Highlights

Takashi Tomie is associated with Nissei Plastic Industrial Co., Ltd., where he has been instrumental in developing new technologies. His expertise in optical recording has positioned him as a valuable asset to the company and the industry.

Collaborations

Throughout his career, Takashi has collaborated with talented individuals such as Kazutomi Suzuki and Kiyoto Takizawa. These partnerships have fostered innovation and have contributed to the success of various projects.

Conclusion

In summary, Takashi Tomie is a distinguished inventor whose work in optical recording technology has made a lasting impact. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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