Miyagi, Japan

Takashi Tamogami

This inventor holds 1 USPTO granted patent. Top assignee: Kyodo Kumiai Joint-Labo Sendai. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takashi Tamogami. Retrieved from https://idiyas.com/inventor/takashi-tamogami-uil0fdz3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Takashi Tamogami: Innovator in Electromagnetic Noise Measurement

Introduction

Takashi Tamogami is a notable inventor based in Miyagi-Ken, Japan. He has made significant contributions to the field of electromagnetic noise measurement, showcasing his innovative spirit through his patented inventions.

Latest Patents

One of his key patents is an electromagnetic noise measurement apparatus. This invention features a first substrate with a first electromagnetic noise sensor that intersects perpendicularly with a second substrate containing a second electromagnetic noise sensor. The apparatus is designed to record induced voltage values from both sensors, allowing for the determination of electromagnetic noise levels and the direction of noise sources in the vicinity of the integral substrate.

Career Highlights

Tamogami is associated with Kyodo Kumiai Joint Laboratory in Sendai, where he continues to develop and refine his inventions. His work has been instrumental in advancing the understanding and measurement of electromagnetic noise, which is crucial in various technological applications.

Collaborations

He collaborates with notable colleagues, including Kenichi Arai and Masahiro Yamaguchi, who contribute to his research and development efforts.

Conclusion

Takashi Tamogami's innovative work in electromagnetic noise measurement exemplifies the impact of dedicated inventors in technology. His contributions continue to influence the field and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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