Takashi Shibamiya

Title: Takashi Shibamiya: Innovator in Contact Area Measurement Technology

Introduction

Takashi Shibamiya is a notable inventor based in Fuchu, Japan. He has made significant contributions to the field of measurement technology, particularly with his innovative patent related to contact area measurement devices. His work has implications in various scientific and industrial applications.

Latest Patents

Shibamiya holds a patent for a "Contact area measurement device and method for measuring contact area." This novel apparatus includes a light transmissive substrate that comes into contact with a specimen. It features illumination means for shining white light through the substrate, interference image acquisition means for capturing the interference image produced by light reflected off both the specimen and the substrate, and intensity histogram creation means for generating an intensity histogram from the interference image. The contact area computation means then calculates the contact area from the intensity histogram, utilizing optimized approximation of complex normal distribution to separate the histogram into multiple normal distributions.

Career Highlights

Throughout his career, Takashi Shibamiya has worked with prestigious institutions, including the Tokyo University of Agriculture and Technology and NSK-Warner K.K. His experience in these organizations has allowed him to refine his skills and contribute to advancements in measurement technology.

Collaborations

Shibamiya has collaborated with notable colleagues such as Masao Eguchi and Manabu Sawayanagi. Their joint efforts have furthered research and development in the field of contact area measurement.

Conclusion

Takashi Shibamiya's innovative work in contact area measurement technology exemplifies the impact of dedicated inventors in advancing scientific understanding and industrial applications. His contributions continue to influence the field and inspire future innovations.