Yokohama, Japan

Takashi Konda

This inventor holds 1 USPTO granted patent and 5 published patent applications and 2 EPO patents. Top assignee: Kabushiki Kaisha Toshiba. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takashi Konda. Retrieved from https://idiyas.com/inventor/takashi-konda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 55(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Takashi Konda: Inventor in Object Detection

Introduction

Takashi Konda is an inventor associated with Yokohama, Japan. His patent work includes an apparatus and method for distinguishing objects using image processing and sensor data. His record lists 1 patent.

Latest Patents

Konda’s listed patent, “Object Discriminating Apparatus and Method Therefor,” describes a system that uses an obstacle sensor to trigger the capture of a two-dimensional image. The system subtracts a stored background image to identify the detected area, then transforms that image data into a three-dimensional space. A central control unit calculates the image’s projection area on a selected plane and compares it with stored reference data to discriminate the object.

Career Highlights

Konda’s professional associations include Kabushiki Kaisha Toshiba and Ueda Japan Radio Co., Ltd. His patent reflects work on combining obstacle detection, image processing, and three-dimensional analysis.

Collaborations

Konda’s listed coworkers include Arisa Fujioka and Chihiro Tomita.

Conclusion

Takashi Konda’s recorded invention applies image processing and three-dimensional projection analysis to object discrimination, reflecting his work in sensor-based detection technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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