Yokohama, Japan

Takashi Iwata

This inventor holds 1 USPTO granted patent. Top assignee: Iwatsu Electric Company Ltd.. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takashi Iwata. Retrieved from https://idiyas.com/inventor/takashi-iwata-bmd68kxr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Takashi Iwata

Introduction

Takashi Iwata is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of printing technology, particularly through his innovative methods for adjusting printing density.

Latest Patents

Iwata holds a patent for a "Method of density adjustment for a magnetic printing apparatus." This invention involves varying the dimensions of a magnetized pattern formed on a recording medium, which in turn adjusts the amount of toner attracted to the medium. By varying the pulse width of the recording clock supplied to a latent image recording circuit, Iwata's method enables stable adjustment of printing density. He has 1 patent to his name.

Career Highlights

Iwata is associated with Iwatsu Electric Company Ltd., where he has been able to apply his expertise in printing technology. His work has contributed to advancements in the efficiency and quality of printing processes.

Collaborations

Iwata has collaborated with notable colleagues such as Kunio Kinoshita and Keiichi Ono, further enhancing the innovative environment at Iwatsu Electric Company Ltd.

Conclusion

Takashi Iwata's contributions to printing technology through his patented methods demonstrate his commitment to innovation and excellence in his field. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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