Takashi Ishibashi

Title: Takashi Ishibashi: Innovator in Semiconductor Technology

Introduction

Takashi Ishibashi is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology, holding two patents that showcase his innovative approach to error detection and dynamic latch circuits.

Latest Patents

Ishibashi's latest patents include a semiconductor device and error detection methods. This semiconductor device features a syndrome generation circuit that generates a syndrome code based on data and an error correction code. It also includes an error determination circuit that detects a 1-bit error in the data using the syndrome code. Additionally, a multi-bit error detection circuit determines if the data with a detected 1-bit error includes a multi-bit error by utilizing an error address and an error syndrome code. His second patent is for a dynamic latch circuit fabricated in a semiconductor integrated circuit. This circuit comprises a clocked inverter and an inverter, connected by a holding line. The design incorporates at least three interconnection layers insulated by layers, optimizing the coupling capacitance between the holding line and a through line.

Career Highlights

Throughout his career, Takashi Ishibashi has worked with notable companies such as NEC Corporation and Renesas Electronics Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in semiconductor technology.

Collaborations

Ishibashi has collaborated with various professionals in his field, including his coworker Hiroyuki Hashimoto. Their joint efforts have furthered the development of innovative solutions in semiconductor devices.

Conclusion

Takashi Ishibashi's work in semiconductor technology exemplifies his commitment to innovation and excellence. His patents reflect a deep understanding of error detection and circuit design, making him a valuable contributor to the industry.