Musashino, Japan

Takashi Akiyama


 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Takashi Akiyama: Innovator in Three-Dimensional Confocal Microscopy

Introduction

Takashi Akiyama is a prominent inventor based in Musashino, Japan. He is known for his significant contributions to the field of microscopy, particularly through his innovative designs that enhance imaging technology. His work has led to advancements that are crucial for various scientific applications.

Latest Patents

Akiyama holds a patent for a three-dimensional confocal microscope. This invention realizes a three-dimensional confocal microscope in which mechanical vibrations do not occur in the scanning unit for scanning in the direction of the optical axis. It allows for high-speed scanning in the direction of the optical axis. The invention features a confocal microscope equipped with a confocal scanner that enables the acquisition of confocal images of samples. A key component of this design is a variable-focus lens of surface tension control type, which has no moving parts, serving as the field lens.

Career Highlights

Takashi Akiyama is associated with Yokogawa Electric Corporation, a company renowned for its technological innovations. His work at the company has been instrumental in pushing the boundaries of optical imaging technology. Akiyama's dedication to research and development has positioned him as a key figure in the field.

Collaborations

Akiyama has collaborated with notable colleagues, including Takayuki Kei and Kenta Mikuriya. Their teamwork has contributed to the successful development of advanced imaging technologies.

Conclusion

Takashi Akiyama's contributions to the field of microscopy, particularly through his patented three-dimensional confocal microscope, highlight his innovative spirit and dedication to advancing scientific research. His work continues to influence the way we visualize and understand complex samples.

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