The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2006
Filed:
Aug. 31, 2004
Applicants:
Takashi Akiyama, Musashino, JP;
Takayuki Kei, Musashino, JP;
Kenta Mikuriya, Musashino, JP;
Inventors:
Assignee:
Yokogawa Electric Corp., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
This invention realizes a three-dimensional confocal microscope in which mechanical vibrations do not occur in the scanning unit for scanning in the direction of optical axis, and in which scanning in the direction of optical axis can be carried out at a high speed. This invention has the following features. In the confocal microscope having a confocal scanner attached to an optical microscope and constructed to enable acquisition of an image of a sample as a confocal image by the confocal scanner, a variable-focus lens of surface tension control type having no moving part is uses as the field lens.