Hino, Japan

Takao Kurohata



Average Co-Inventor Count = 2.1

ph-index = 7

Forward Citations = 120(Granted Patents)


Location History:

  • Hachioji, JP (1995 - 2008)
  • Tokyo, JP (1995 - 2011)
  • Toyohashi, JP (2013 - 2017)
  • Hino, JP (2007 - 2022)

Company Filing History:


Years Active: 1995-2022

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31 patents (USPTO):Explore Patents

Title: Takao Kurohata: Innovating Inspection Technologies

Introduction: Takao Kurohata, located in Hino, Japan, is a notable inventor with a substantial portfolio of 31 patents. His work primarily focuses on inspection systems that enhance the accuracy and efficiency of image processing tasks in various applications.

Latest Patents: Kurohata's latest patents revolve around an advanced inspection system, method, and program. This system includes an inspection part that compares scanned images, obtained from sheets on which images are formed based on specific jobs, with pre-prepared reference images. The hardware processor identifies pages as inspection targets or non-inspection targets. It facilitates selective inspection based on these settings and generates an inspection report that encompasses all pages, including those not inspected.

Career Highlights: Kurohata has built a significant career within prominent companies, notably Konica Minolta Business Technologies, Inc. and Konica Minolta, Inc. His contributions to these organizations showcase his expertise in developing cutting-edge imaging technologies, particularly in inspection methodologies.

Collaborations: Throughout his career, Kurohata has collaborated with esteemed professionals, including Jun Yokobori and Shoichi Nakamura. Their joint efforts in various projects have contributed to the advancement of technology in the field of image processing and inspection systems.

Conclusion: Takao Kurohata stands out as an influential figure in the innovation of inspection technologies. His extensive patent portfolio and collaborations with notable colleagues exemplify his commitment to enhancing technological capabilities within his field. With continual advancements, his work is likely to play a pivotal role in the evolution of inspection systems and methodologies.

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