Tokyo, Japan

Takao Inoh

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Ebara Environmental Plant Co., Ltd., Hibot Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takao Inoh. Retrieved from https://idiyas.com/inventor/takao-inoh-488sbt2d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Takao Inoh

Introduction

Takao Inoh is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of ultrasonic technology, particularly in the inspection of pipes. His innovative approach addresses common challenges faced in ultrasonic measurements.

Latest Patents

Inoh holds a patent for an "Ultrasonic probe and method for measuring thickness of pipe being inspected using the same." This invention addresses the problem of signal scattering and interference that occurs when using flat plate-like transducers in ultrasonic probes. By curving the transducers to match the internal shape of the pipe, Inoh's design allows ultrasonic waves to be emitted perpendicularly to the pipe wall. This results in clearer data and more accurate measurements of pipe thickness.

Career Highlights

Throughout his career, Takao Inoh has worked with several prominent companies. He has been associated with Hibot Corporation and Ebara Environmental Plant Co., Ltd. His experience in these organizations has contributed to his expertise in ultrasonic technology and innovation.

Collaborations

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Conclusion

Takao Inoh's contributions to ultrasonic technology demonstrate his innovative spirit and commitment to solving complex engineering problems. His patented inventions continue to influence the field of pipe inspection and measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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