Nagaokakyo, Japan

Takamori Igarashi

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Murata Manufacturing Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takamori Igarashi. Retrieved from https://idiyas.com/inventor/takamori-igarashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Takamori Igarashi and Multilayer Ceramic Innovation

Introduction

Takamori Igarashi is an inventor associated with Nagaokakyo, Japan, and Murata Manufacturing Co., Ltd. His recorded patent work concerns the design of a multilayer ceramic electronic component. The available information lists 1 patent.

Latest Patents

Igarashi is named on a patent titled “Multilayer Ceramic Electronic Component.” The invention describes a ceramic layer containing a Ba—Nd—Ti oxide, forsterite, barium borosilicate glass, and MnO, together with an electrode in contact with that layer. It further specifies a region of uneven neodymium distribution at the interface between the ceramic layer and the electrode.

Career Highlights

The listed patent reflects Igarashi’s work on ceramic materials and electrode interfaces in electronic components. His association with Murata Manufacturing Co., Ltd. connects this work to a company active in electronic components.

Collaborations

Hirofumi Oie and Makoto Takada are identified as Igarashi’s coworkers. The provided information does not specify their roles in the patent or describe particular joint projects.

Conclusion

Takamori Igarashi’s recorded invention focuses on the composition and interface structure of a multilayer ceramic electronic component, highlighting his contribution to materials and component design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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