Tokyo, Japan

Takahiro Yamakura

USPTO Granted Patents = 1 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Takahiro Yamakura

Introduction

Takahiro Yamakura is a prominent inventor based in Tokyo, Japan. He is known for his significant contributions to the field of film thickness measurement technology. With a focus on precision and accuracy, Yamakura has developed innovative solutions that enhance measurement capabilities in various applications.

Latest Patents

Yamakura holds a patent for a film thickness measuring device and method. This device is equipped with a light source, a spectroscopic sensor, a processor, and a storage unit. The design allows light from the source to vertically enter a plane that is being measured, which is covered with a film. The light reflected from this plane is captured by the spectroscopic sensor. The storage unit contains theoretical values of reflectivity distributions and color characteristic variables for different film thicknesses. The processor utilizes these theoretical values to determine the film thickness based on the reflectivity distribution measured by the sensor. This innovative approach significantly improves the accuracy of film thickness measurements.

Career Highlights

Takahiro Yamakura is currently employed at Nireco Corporation, where he continues to advance his research and development efforts. His work at Nireco has positioned him as a key player in the field of measurement technology. Yamakura's dedication to innovation has led to the successful implementation of his patented technology in various industrial applications.

Collaborations

Yamakura collaborates with talented colleagues, including Takeo Yamada and Takeshi Yamamoto. Together, they work on projects that push the boundaries of measurement technology and contribute to the advancement of their field.

Conclusion

Takahiro Yamakura's contributions to film thickness measurement technology exemplify the impact of innovative thinking in engineering. His patented device represents a significant advancement in measurement accuracy, showcasing his commitment to excellence in his field.

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