Kanagawa, Japan

Takahiro Murase

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Kelk Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takahiro Murase. Retrieved from https://idiyas.com/inventor/takahiro-murase-vohkyo4d

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Takahiro Murase: Innovator in State Estimation Systems

Introduction

Takahiro Murase is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of state estimation systems, showcasing his expertise and innovative spirit. His work is particularly recognized for its practical applications in technology.

Latest Patents

Takahiro Murase holds a patent for a state estimation system. This system includes a thermal load detection unit that detects the thermal load of a device as an object. Additionally, it features an estimation unit that estimates the state of the device based on the thermal load detected by the thermal load detection unit. This invention demonstrates his ability to integrate complex systems for enhanced functionality.

Career Highlights

Takahiro Murase is currently employed at Kelk Ltd., where he continues to develop innovative solutions in his field. His work at the company has allowed him to collaborate with other talented professionals and contribute to advancements in technology.

Collaborations

One of his notable coworkers is Daisuke Goto. Together, they work on various projects that aim to push the boundaries of technology and innovation.

Conclusion

Takahiro Murase is a distinguished inventor whose work in state estimation systems exemplifies his commitment to innovation. His contributions continue to impact the technological landscape positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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