Otsu, Japan

Takahiro Murai

This inventor holds 1 USPTO granted patent. Top assignee: Toray Industries, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takahiro Murai. Retrieved from https://idiyas.com/inventor/takahiro-murai-ehvaeuln

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Takahiro Murai

Introduction

Takahiro Murai is a notable inventor based in Otsu, Japan. He has made significant contributions to the field of radiation detection technology. His work focuses on enhancing the performance and durability of scintillator panels.

Latest Patents

Murai holds a patent for a scintillator panel, which is integral to radiation detectors and inspection devices. The patent details a scintillator panel designed to reduce brightness deterioration due to irradiation while achieving higher brightness levels. The scintillator panel comprises a substrate and a scintillator layer containing phosphors. Notably, the scintillator layer includes a binder resin with a π-conjugated structure made up of seven or more atoms. The glass transition temperature of the binder resin ranges from 30 to 430° C., and the thickness of the scintillator layer is between 50 to 800 μm.

Career Highlights

Murai is currently employed at Toray Industries, Inc., where he continues to innovate in the field of radiation detection. His work has been pivotal in advancing technologies that enhance the safety and efficiency of radiation inspection methods.

Collaborations

Murai collaborates with esteemed colleagues, including Sho Miyao and Yasuhiro Kobayashi, who contribute to his research and development efforts.

Conclusion

Takahiro Murai's contributions to scintillator technology exemplify the importance of innovation in radiation detection. His work not only improves the functionality of detection devices but also enhances safety in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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