Chiba, Japan

Takahiro Misu

This inventor holds 1 USPTO granted patent. Top assignee: Phc Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takahiro Misu. Retrieved from https://idiyas.com/inventor/takahiro-misu-pb1bot6f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Takahiro Misu

Introduction

Takahiro Misu is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of testing instruments. His work is recognized for its innovation and practicality, which has garnered attention in the industry.

Latest Patents

Takahiro Misu holds a patent for a testing instrument. This invention showcases his ability to create tools that enhance testing processes, reflecting his expertise and dedication to innovation. He has 1 patent to his name, highlighting his contributions to technological advancements.

Career Highlights

Misu is currently employed at PHC Corporation, where he continues to develop and refine his inventions. His role at the company allows him to collaborate with other talented professionals in the field. His career is marked by a commitment to improving testing methodologies and contributing to the scientific community.

Collaborations

Takahiro Misu has worked alongside talented colleagues such as Yuta Moriwake and Masakazu Mori. These collaborations have fostered an environment of creativity and innovation, leading to the development of cutting-edge technologies.

Conclusion

Takahiro Misu is a distinguished inventor whose work in testing instruments has made a significant impact in his field. His dedication to innovation and collaboration with skilled professionals continues to drive advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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