Takahiro Kamikawa

This inventor holds 1 USPTO granted patent. Top assignees: Kabushiki Kaisha Toshiba, Toshiba Information Systems (Japan) Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takahiro Kamikawa. Retrieved from https://idiyas.com/inventor/takahiro-kamikawa-up4443kc

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Takahiro Kamikawa: Innovator in Optical Inspection Technology

Introduction

Takahiro Kamikawa is a notable inventor recognized for his contributions to optical inspection technology. He has developed innovative methods that enhance the efficiency and accuracy of optical inspections in various applications.

Latest Patents

Kamikawa holds a patent for an "Optical Inspection Method, Non-Transitory Storage Medium, and Optical Inspection Apparatus." This invention represents a significant advancement in the field, showcasing his expertise and commitment to innovation.

Career Highlights

Throughout his career, Takahiro Kamikawa has worked with prominent companies, including Kabushiki Kaisha Toshiba and Toshiba Information Systems Corporation. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking technologies.

Collaborations

Kamikawa has collaborated with various professionals in the field, including his coworker Hiroya Kano. These partnerships have fostered a creative environment that encourages the development of new ideas and solutions.

Conclusion

Takahiro Kamikawa's work in optical inspection technology exemplifies the impact of innovation on industry practices. His patent and career achievements highlight his role as a significant contributor to technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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