Nagoya, Japan

Takahiko Togashi

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Rayon Company, Limited. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takahiko Togashi. Retrieved from https://idiyas.com/inventor/takahiko-togashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Takahiko Togashi and His Patent for EMI-Shielding Yarn.

Introduction

Takahiko Togashi is an inventor associated with Nagoya, Japan, and Mitsubishi Rayon Company, Limited. His recorded patent concerns a textile yarn designed to combine suitability for clothing with electromagnetic interference (EMI) shielding.

Latest Patents

Togashi is credited with 1 patent: “Thin-metal-wire conjugated yarn.” The invention describes a core made from a thin metal wire with a diameter of 50 micrometers or less, combined with a chemical, synthetic, or natural fiber yarn. Another fiber yarn is wound around the core as a sheath, with a coating percentage of at least 70% of the conjugated yarn’s surface area. The design aims to provide EMI shielding while remaining suitable for clothing.

Career Highlights

Togashi’s listed patent is associated with Mitsubishi Rayon Company, Limited. It reflects work at the intersection of textile construction and functional materials, using a fine metal wire within a fiber-based yarn structure.

Collaborations

Yoshiyuki Mori and Yoshinori Sato are identified as Togashi’s coworkers. The available information does not specify their roles in the patent or the extent of their collaboration.

Conclusion

Takahiko Togashi’s recorded invention combines a thin metal wire and fiber yarns to create a clothing-suitable textile with EMI-shielding properties.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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