Hachioji, Japan

Takaaki Takenobu

This inventor holds 1 USPTO granted patent. Top assignee: Olympus Optical Company, Ltd.. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Takaaki Takenobu. Retrieved from https://idiyas.com/inventor/takaaki-takenobu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Takaaki Takenobu: Innovator in Scanning Tunneling Microscopy

Introduction

Takaaki Takenobu is a prominent inventor based in Hachioji, Japan. He has made significant contributions to the field of microscopy, particularly with his innovative work on scanning tunneling microscopes. His expertise and dedication to advancing technology have earned him recognition in the scientific community.

Latest Patents

Takaaki Takenobu holds a patent for a probe designed for a scanning tunneling microscope. This invention enhances the capabilities of the microscope, allowing for more precise measurements and observations at the atomic level. His patent portfolio includes 1 patent that showcases his inventive prowess.

Career Highlights

Currently, Takaaki Takenobu is employed at Olympus Optical Company, Ltd. This company is renowned for its cutting-edge optical and imaging products. His role at Olympus has allowed him to work on various projects that push the boundaries of optical technology.

Collaborations

Takaaki has collaborated with notable colleagues, including Takao Okada and Tsugiko Takase. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Takaaki Takenobu is a distinguished inventor whose work in scanning tunneling microscopy has made a lasting impact on the field. His contributions continue to inspire future advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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