Taizo Wakimura

Title: Taizo Wakimura: Innovator in Surface Defect Detection Technology

Introduction

Taizo Wakimura is a prominent inventor based in Kishiwada, Japan. He has made significant contributions to the field of surface defect detection technology, holding a total of four patents. His work focuses on developing advanced methods and devices for accurately identifying surface defects in various workpieces.

Latest Patents

Wakimura's latest patents include a workpiece surface defect detection device and detection method, as well as a workpiece surface inspection system. These innovations provide a reliable means of detecting small surface defects with high accuracy. The detection device operates by obtaining multiple images of the workpiece while a bright-and-dark pattern from an illumination device is moved relative to it. A tentative defect candidate is extracted from these images, and if the number of images containing this candidate meets a pre-set threshold, it is confirmed as a defect candidate. The device then combines these images to generate a composite image, allowing for precise defect detection.

Career Highlights

Throughout his career, Taizo Wakimura has worked with notable companies such as Konica Minolta Opto, Inc. and Konica Minolta, Inc. His experience in these organizations has contributed to his expertise in optical technologies and defect detection systems.

Collaborations

Wakimura has collaborated with several professionals in his field, including Keiji Matsusaka and Eigo Sano. These collaborations have likely enhanced his research and development efforts, leading to innovative solutions in surface inspection technology.

Conclusion

Taizo Wakimura's contributions to surface defect detection technology exemplify his commitment to innovation and excellence. His patents and career achievements reflect his significant impact on the industry.