The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 2020
Filed:
Apr. 06, 2018
Konica Minolta, Inc., Chiyoda-ku, JP;
Konica Minolta, Inc., Tokyo, JP;
Abstract
According to a surface defect inspection device and a surface defect inspection method according to the present invention, an inspection face of an inspection object is irradiated with illumination light, and a defect at the inspection face is detected, based on an image including the inspection face captured. According to the surface defect inspection device and the surface defect inspection method, the illumination light is emitted with formation of at least one set of a light region and a dark region, and a range of a defect detection image region for the detection of the defect, to be set to the image capturing the inspection face irradiated with the illumination light in the light region, is adjusted in accordance with a previously defined degree of visibility for orange peel, at the detection of the defect at the inspection face.